• DocumentCode
    45096
  • Title

    Compact Models and the Physics of Nanoscale FETs

  • Author

    Lundstrom, Mark S. ; Antoniadis, Dimitri A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    61
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    225
  • Lastpage
    233
  • Abstract
    The device physics of nanoscale MOSFETs is related to traditional compact models. Beginning with the virtual source model, a model for nanoscale MOSFETs expressed in traditional form, we show how the Landauer approach gives a clear physical interpretation to the parameters in the model. The analysis shows that transport in the channel is limited by diffusion near the virtual source both below and above threshold, that the current saturation is determined by velocity saturation near the source, not by the maximum velocity in the channel, and that the channel resistance approaches a finite value as the channel length approaches zero. These results help explain why traditional models continue to work well at the nanoscale, even though carrier transport is distinctly different from that at the microscale, and they identify the essential physics that physics-based compact models for nanoscale MOSFETs should comprehend.
  • Keywords
    MOSFET; nanoelectronics; semiconductor device models; transport processes; carrier transport; channel transport; compact model; current saturation; device physics; maximum velocity; nanoscale FET; nanoscale MOSFET; velocity saturation; virtual source model; Logic gates; MOSFET; Mathematical model; Nanoscale devices; Scattering; Ballistic transport; MOSFETs; nanoelectronics; semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2283253
  • Filename
    6626559