Title :
A State Traversal Algorithm Using a State Covariance Matrix
Author :
Motohara, Akira ; Hosokawa, Toshinpri ; Muraoka, Michiaki ; Maekawa, Hidetsugu ; Kayashima, Kazuhiro ; Shimeki, Yasuharu ; Shin, Seichi
Author_Institution :
Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd., Osaka, Japan
Abstract :
A state traversal algorithm based on control theory and its application to sequential ATPG is presented. In the algorithm, next states are evaluated by an objective function representing "unlikeliness" to reach each of the previously traversed states. Experimental results show that many states are efficiently traversed and that our proposed ATPG can achieve almost the same fault coverage as STG3.
Keywords :
Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Control theory; Covariance matrix; Electrical fault detection; Industrial control; Materials testing; Sequential analysis;
Conference_Titel :
Design Automation, 1993. 30th Conference on
Print_ISBN :
0-89791-577-1
DOI :
10.1109/DAC.1993.203926
