DocumentCode
451869
Title
A State Traversal Algorithm Using a State Covariance Matrix
Author
Motohara, Akira ; Hosokawa, Toshinpri ; Muraoka, Michiaki ; Maekawa, Hidetsugu ; Kayashima, Kazuhiro ; Shimeki, Yasuharu ; Shin, Seichi
Author_Institution
Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd., Osaka, Japan
fYear
1993
fDate
14-18 June 1993
Firstpage
97
Lastpage
101
Abstract
A state traversal algorithm based on control theory and its application to sequential ATPG is presented. In the algorithm, next states are evaluated by an objective function representing "unlikeliness" to reach each of the previously traversed states. Experimental results show that many states are efficiently traversed and that our proposed ATPG can achieve almost the same fault coverage as STG3.
Keywords
Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Control theory; Covariance matrix; Electrical fault detection; Industrial control; Materials testing; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1993. 30th Conference on
ISSN
0738-100X
Print_ISBN
0-89791-577-1
Type
conf
DOI
10.1109/DAC.1993.203926
Filename
1600199
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