An Efficient Partitioning Strategy for Pseudo-Exhaustive Testing

Pseudo-exhaustive testing involves applying all possible input patterns to individual output cones of a circuit. Circuits with output cones driven by a large number of inputs often need to be partitioned to reduce the test application time. In this paper, we present an efficient heuristic partitioning procedure of polynomial complexity. Experiments on combinational benchmark circuits validate the efficiency and quality of our approach.