DocumentCode
451966
Title
Analysis and Reliable Design of ECL Circuits with Distributed RLC Interconnections
Author
Haque, Monjurul ; Chowdhury, S.
Author_Institution
Department of Electrical and Computer Engineering, The University of Iowa, Iowa City, IA
fYear
1993
fDate
14-18 June 1993
Firstpage
697
Lastpage
701
Abstract
An analytical study of the transient response of ECL gates with lossy transmission line interconnections is presented. Closed-form equations for delay, rise time, overshoot, undershoot, and maximum transient current are derived using linearized interface models and rational function approximations to the s-domain equations. The equations have been shown to be accurate within a few percent of SPICE estimates.
Keywords
Delay effects; Distributed parameter circuits; Equations; Function approximation; Integrated circuit interconnections; Power system transients; Propagation losses; RLC circuits; SPICE; Transient response;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1993. 30th Conference on
ISSN
0738-100X
Print_ISBN
0-89791-577-1
Type
conf
DOI
10.1109/DAC.1993.204035
Filename
1600308
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