DocumentCode
45245
Title
Integrated Long-Range Thermal Bimorph Actuators for Parallelizable Bio-AFM Applications
Author
Henriksson, Jonas ; Gullo, Maurizio R. ; Brugger, Juergen
Author_Institution
Microsystems Laboratory, École polytechnique fédérale de Lausanne, Lausanne, Switzerland
Volume
13
Issue
8
fYear
2013
fDate
Aug. 2013
Firstpage
2849
Lastpage
2856
Abstract
Atomic force microscope (AFM)-based cell force spectroscopy is an emerging research method that has already enhanced our understanding of the structural changes that take place in a cell as it becomes cancerous. However, the method is limited as it is not time-efficient in its current state of development. This paper presents the fabrication of an integrated long-range thermal bimorph actuator that controls the z-position of an AFM cantilever in liquid. Multiplied in arrays, such individually actuated probes can parallelize cell force spectroscopy measurements, thereby drastically reducing the time per measured cell. The need to accommodate differences in tip-sample distance implies an individual device actuation range of
out-of-plane. In addition, any cross-talk, i.e., between actuators or between the actuator and the force sensor, must be minimized. To meet these requirements, we design and fabricate a novel thermal bimorph actuator that is paired with a force sensing cantilever. In order to keep temperatures in a bio-friendly range, the design is optimized for high thermomechanical sensitivity. Finite element model simulations confirmed that the surrounding liquid constitutes a large thermal reservoir that absorbs the generated heat without any dramatic temperature increase. Furthermore, given that a cell substrate material of high thermal conductivity is chosen, e.g., Si, the thermal coupling between the cell and the substrate, dominates over that between the cell and the actuator. Suspended silicon nitride structures with platinum electrodes are microfabricated through standard techniques. The finalized actuator is able to displace the cantilever out-of-plane by
in air, corresponding well to estimations.
Keywords
Atomic force microscopy; Force sensors; Microactuators; Microsensors; Atomic force microscopy; force sensors; microactuators; microsensors;
fLanguage
English
Journal_Title
Sensors Journal, IEEE
Publisher
ieee
ISSN
1530-437X
Type
jour
DOI
10.1109/JSEN.2013.2261293
Filename
6512551
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