DocumentCode :
452846
Title :
Multi-Dimension Combining (MDC) in abstract Level and Hierarchical MDC (HMDC) to Improve the Classification Accuracy of Enoses
Author :
Chen, Hong ; Goubran, Rafik A. ; Mussivand, Tofy
Author_Institution :
Dept. of Syst. & Comput. Eng., Carleton Univ., Ottawa, Ont.
Volume :
1
fYear :
2005
fDate :
16-19 May 2005
Firstpage :
683
Lastpage :
686
Abstract :
This paper proposes a new classification algorithm for improving the accuracy of electronic noses. The algorithm extends the conventional multi-dimension combining (MDC) of measurement level (PARC method as multilayer perceptron, or MLP) into abstract level (PARC methods as k-nearest neighbor (KNN), linear discriminant analysis (LDA) and probabilistic neural network (PNN)) and hierarchical level (HMDC, or hierarchical multidimension combining). The performance of the proposed algorithm is evaluated using experimental data and Enose device of Cyranose 320
Keywords :
electronic noses; feature extraction; multilayer perceptrons; pattern classification; Cyranose 320; PARC method; classification algorithm; electronic noses; feature extraction; hierarchical MDC; k-nearest neighbor; linear discriminant analysis; multi-dimension combining; multilayer perceptron; pattern recognition; probabilistic neural network; Electronic noses; Feature extraction; Linear discriminant analysis; Multi-layer neural network; Multilayer perceptrons; Neural networks; Pattern recognition; Sensor arrays; Signal processing algorithms; Systems engineering and theory; HMDC (Hierarchical MDC); MDC (Multi-Dimension Combining); dimension reduction; electronic nose; feature extraction; pattern recognition (PARC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
Type :
conf
DOI :
10.1109/IMTC.2005.1604204
Filename :
1604204
Link To Document :
بازگشت