DocumentCode
453343
Title
Nondestructive and simultaneous measurement of complex EM parameters with scalar reflectometer
Author
Chen, Chun-Ping ; Ma, Zhewang ; Anada, Tetsuo ; Hsu, Jui-Pang ; Xu, Deming
Author_Institution
High-Tech Res. Center, Kanagawa Univ., Yokohama, Japan
Volume
4
fYear
2005
fDate
4-7 Dec. 2005
Abstract
A scalar reflectometer based, low cost method, named "multi-thickness method" (MTM), is proposed for non destructively and simultaneously characterizing the complex permittivity and permeability of high loss materials via an open-ended coaxial probe. The measurement system is established, while the sample-loaded open-ended coaxial probe is modeled by the spectral domain immitance (SDI) method. A discussion about how to select the multi thicknesses of test sample is also included based on the analysis and our experiences. The broadband frequency-swept measurement has been conducted on a typical absorbing material under different thicknesses combination conditions. The experiment results agree well with the reference data, which validates the feasibility and effectiveness of this improved technique.
Keywords
electromagnetic wave propagation; measurement systems; probes; reflectometers; absorbing material; broadband frequency-swept measurement; complex EM parameters; complex permittivity; measurement system; multi-thickness method; open-ended coaxial probe; permeability; scalar reflectometer; spectral domain immitance method; Admittance; Coaxial components; Conducting materials; Costs; Electromagnetic compatibility; Frequency; Loss measurement; Probes; Reflection; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN
0-7803-9433-X
Type
conf
DOI
10.1109/APMC.2005.1606808
Filename
1606808
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