Title :
High-performance and low-voltage challenges for sub-45nm microprocessor circuits
Author :
Krishnamurthy, Ram K. ; Mathew, Sanu K. ; Anders, Mark A. ; Hsu, Steven K. ; Kaul, Himanshu ; Borkar, Shekhar
Author_Institution :
Microprocessor Technol. Labs, Intel Corp., Hillsboro, OR, USA
Abstract :
Increasingly aggravated challenges in CMOS technology scaling beyond the 45nm node has resulted in several new design paradigm shifts necessary for high-performance and low-power microprocessors. This paper discusses some of the key technology challenges and the associated design paradigm shifts. High-performance and low-voltage energy-efficient circuit techniques to combat (i) increasing switching and active leakage power dissipation, (ii) poor leakage tolerance of large-signal cache arrays and register files, and (iii) worsening global on-chip interconnect scaling trend, are presented.
Keywords :
CMOS digital integrated circuits; integrated circuit interconnections; low-power electronics; microprocessor chips; CMOS technology; large signal cache arrays; low-power microprocessors; microprocessor circuits; on-chip interconnect; poor leakage tolerance; power dissipation; register files; CMOS technology; Central Processing Unit; Clocks; Dynamic voltage scaling; Frequency; Integrated circuit interconnections; Microprocessors; Paper technology; Registers; Repeaters;
Conference_Titel :
ASIC, 2005. ASICON 2005. 6th International Conference On
Print_ISBN :
0-7803-9210-8
DOI :
10.1109/ICASIC.2005.1611299