DocumentCode :
453671
Title :
An automatic calibration technique for the OPAMP and its former stage output offset
Author :
Shubao, Guo ; Xiaoyan, Zheng ; Yulin, Qiu
Author_Institution :
Inst. of Microelectron., Chinese Acad. of Sci., Beijing
Volume :
1
fYear :
2005
fDate :
24-0 Oct. 2005
Firstpage :
656
Lastpage :
660
Abstract :
An automatic calibration technique is developed to trim the differential OPAMP´s input-referred and its former output stage offset voltages. The offset voltage is reduced by digitally adjusting the resulting offset current at the input and its first output stage. Without using complex circuits, the technique just need a comparator, a simple control logical and a current DAC (I-DAC). The proposed circuits have been designed in a 0.25 mum digital CMOS process. The OPAMP can calibrate a maximum offset of plusmn6 mV. The measured input referred offset voltage is less than 100 muV
Keywords :
CMOS digital integrated circuits; current comparators; differential amplifiers; digital-analogue conversion; operational amplifiers; 0.25 micron; automatic calibration technique; comparator; control logical; current DAC; differential OPAMP; digital CMOS process; digital-analog converter; offset current; offset voltage; operational amplifier; Analog-digital conversion; Automatic control; CMOS process; Calibration; Capacitors; Counting circuits; Microelectronics; Signal generators; Switches; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9210-8
Type :
conf
DOI :
10.1109/ICASIC.2005.1611334
Filename :
1611334
Link To Document :
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