Title :
A practical method to estimate interconnect responses to variabilities
Author_Institution :
IBM Austin Res. Lab, TX
Abstract :
Variabilities in metal interconnect structures can affect circuit timing performance or even cause function failure in VLSI designs. This paper proposes a method to estimate the difference between the nominal and perturbed circuit waveforms by calculating the moments in frequency-domain via efficient iterative method. The algorithm can be used to accurately reproduce the differential waveforms, or to provide efficient early estimates on the timing impact of the variabilities for RC networks
Keywords :
RC circuits; circuit analysis computing; integrated circuit interconnections; integrated circuit modelling; iterative methods; method of moments; reduced order systems; timing; waveform analysis; RC networks; VLSI designs; circuit timing; circuit variabilities; function failure; interconnect responses; iterative method; metal interconnect structures; nominal circuit waveform; perturbed circuit waveforms; timing impact; Algorithm design and analysis; Differential equations; Frequency estimation; Integrated circuit interconnections; Iterative algorithms; Iterative methods; Reduced order systems; Taylor series; Timing; Very large scale integration;
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
DOI :
10.1109/DATE.2006.243893
