• DocumentCode
    454449
  • Title

    Enabling Fine-Grain Leakage Management by Voltage Anchor Insertion

  • Author

    Babighian, Pietro ; Benini, Luca ; Macii, Alberto ; Macii, Enrico

  • Author_Institution
    Politecnico di Torino
  • Volume
    1
  • fYear
    2006
  • fDate
    6-10 March 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Functional unit shutdown based on MTCMOS devices is effective for leakage reduction in aggressively scaled technologies. However, the applicability of MTCMOS-based shutdown in a synthesis-based design flow poses the challenge of interfacing logic blocks in shutdown mode with active units: The outputs of inactive gates can float at intermediate voltages, causing very large short-circuit currents in the active gates they drive. In this paper, we propose two novel low-overhead elementary cells that fully address this issue. These cells can be added to any synthesis library, and they can be inserted into a netlist at the boundary between shutdown and active regions. Our results show that: (i) our cells solve the interfacing problem with minimum overhead; and (ii) a non-intrusive design flow enhancement is sufficient to automatically insert interface cells in post-synthesis netlists
  • Keywords
    CMOS logic circuits; leakage currents; logic design; threshold logic; MTCMOS-based shutdown; fine-grain leakage management; leakage reduction; logic blocks; low-overhead elementary cells; short-circuit currents; synthesis-based design flow; voltage anchor insertion; CMOS logic circuits; CMOS technology; Leakage current; Logic design; Logic devices; Logic gates; MOSFETs; Sleep; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
  • Conference_Location
    Munich
  • Print_ISBN
    3-9810801-1-4
  • Type

    conf

  • DOI
    10.1109/DATE.2006.243770
  • Filename
    1657011