• DocumentCode
    45556
  • Title

    Maximizing Fabrication and Thermal Tolerances of All-Silicon FIR Wavelength Filters

  • Author

    Dwivedi, Sarvagya ; D´heer, Herbert ; Bogaerts, Wim

  • Author_Institution
    Dept. of Inf. Technol., imec, Ghent Univ., Ghent, Belgium
  • Volume
    27
  • Issue
    8
  • fYear
    2015
  • fDate
    April15, 15 2015
  • Firstpage
    871
  • Lastpage
    874
  • Abstract
    We propose a method to make silicon optical finite impulse response filters tolerant to fabrication (waveguide geometry) and ambient thermal variations. We experimentally demonstrate a Mach-Zehnder interferometer filter with fabrication and thermal tolerance, both separately and together. The fabrication-tolerant device measurements show a 20-fold improved tolerance to systematic waveguide linewidth variations with a wavelength shift of <;60 pm/nm linewidth change. The fabrication- and thermal-tolerant device is possible using orthogonal polarizations in the two arms. The fabricated device shows a shift of less than ±65 pm/nm and a thermal drift smaller than ±15 pm/K over a wavelength range of 40 nm. Simulations show that this concept can be extended to multichannel filters.
  • Keywords
    FIR filters; Mach-Zehnder interferometers; elemental semiconductors; geometrical optics; light polarisation; optical fabrication; optical testing; optical waveguide filters; silicon; Mach-Zehnder interferometer filter; Si; all-silicon FIR wavelength filters; fabrication-tolerant device measurements; multichannel filters; orthogonal polarizations; silicon optical finite impulse response filters; systematic waveguide linewidth variations; thermal drift; thermal-tolerant device measurements; waveguide geometry; Fabrication; Finite impulse response filters; Optical filters; Optical waveguides; Sensitivity; Temperature measurement; Temperature sensors; Silicon photonics; athermal; fabrication tolerances; wavelength filtering devices;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2015.2398464
  • Filename
    7029048