• DocumentCode
    45567
  • Title

    Broadband complementary metal-oxide semiconductor single-pole-double-throw switch with improved power handling capability using dual-gate metal-oxide semiconductor field-effect transistors

  • Author

    Fan-Hsiu Huang ; Yue-Ming Hsin

  • Author_Institution
    Dept. of Electron. Eng., Chang Gung Univ., Kweishan, Taiwan
  • Volume
    9
  • Issue
    6
  • fYear
    2015
  • fDate
    4 24 2015
  • Firstpage
    502
  • Lastpage
    507
  • Abstract
    A broadband complementary metal-oxide semiconductor (CMOS) single-pole-double-throw (SPDT) switch based on a travelling-wave design with using dual-gate N-type metal-oxide semiconductor (NMOS) transistors is implemented in a 0.18 μm CMOS process for millimetre-wave applications. To further investigate the power handling capability in a dual-gate metal-oxide semiconductor field-effect transistor (MOSFET), this study analyses the mechanism of voltage swing distribution by using the proposed large-signal cascode model. Considering the parasitic gate-to-gate capacitance and the substrate effect, the simulations in this study can accurately predict the small-signal and power handling performances of the SPDT switch. The switch exhibits a measured 1 dB bandwidth of ~51 GHz, ranging from 16 to 67 GHz with an insertion loss of 3.6 dB at 30 GHz. The measured isolation is also better than 22 dB. The measured power handling capability can achieve a 1 dB compression point at an input power of 23.8 dBm at 30 GHz with a negative body bias, and the simulation result shows a 1 dB compression point nearly 24 dBm. Based on the proposed model, the large-signal performances under different body biases can be significantly predicted when including the parasitic gate-to-gate capacitance in a dual-gate MOSFET.
  • Keywords
    CMOS integrated circuits; MOSFET; radiocommunication; voltage distribution; CMOS single-pole-double-throw switch; broadband complementary metal-oxide semiconductor single-pole-double-throw switch; dual-gate MOSFET; dual-gate NMOS transistors; dual-gate metal-oxide semiconductor field-effect transistors; frequency 16 GHz to 67 GHz; large-signal cascode model; millimetre-wave applications; parasitic gate-to-gate capacitance; power handling capability; substrate effect; travelling-wave design; voltage swing distribution;
  • fLanguage
    English
  • Journal_Title
    Microwaves, Antennas & Propagation, IET
  • Publisher
    iet
  • ISSN
    1751-8725
  • Type

    jour

  • DOI
    10.1049/iet-map.2013.0463
  • Filename
    7095704