• DocumentCode
    456265
  • Title

    Combining random backoff with a cross-layer tree algorithm for random access in IEEE 802.16

  • Author

    Wang, Xin ; Yu, Yingqun ; Giannakis, Georgios B.

  • Author_Institution
    Dept. of ECE, Minnesota Univ., Minneapolis, MN
  • Volume
    2
  • fYear
    2006
  • fDate
    3-6 April 2006
  • Firstpage
    972
  • Lastpage
    977
  • Abstract
    We investigate the potential for high throughput when combining random backoff schemes with a robust cross-layer tree algorithm (TA) for wireless random access. We first develop a BEB-SICTA/FS protocol which combines the binary exponential backoff (BEB) algorithm with a recently proposed SICTA/FS protocol saturation throughput analysis of BEB-SICTA/FS motivates the combined protocol herein because: 1) by using the practically feasible SICTA/FS to resolve collisions in a conventional BEB based protocol for wireless random access, we can achieve high throughput; and 2) BEB can sufficiently reduce the collision size and thus enhance the efficiency of SICTA/FS, since SICTA/FS is more efficient when the number of initially collided packets is small. Guided by our analysis, we further put forth a GBEB-SICTA/FS protocol which is capable of higher and more steadfast saturation throughput than BEB-SICTA/FS. Finally, we tailor our protocols for the IEEE 802.16 broadband wireless access (BWA) networks and test their performance through simulations
  • Keywords
    WiMax; access protocols; broadband networks; radio access networks; BEB-SICTA/FS protocol; IEEE 802.16; binary exponential backoff; broadband wireless access; cross-layer tree algorithm; random access; random backoff; saturation throughput analysis; Access protocols; Collaborative work; Computer aided analysis; Government; Multiaccess communication; Robustness; Silicon carbide; System recovery; Throughput; Wireless application protocol;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications and Networking Conference, 2006. WCNC 2006. IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1525-3511
  • Print_ISBN
    1-4244-0269-7
  • Electronic_ISBN
    1525-3511
  • Type

    conf

  • DOI
    10.1109/WCNC.2006.1683601
  • Filename
    1683601