• DocumentCode
    45628
  • Title

    A New String Decoding Scheme for Enhancing Array Block Efficiency of Vertical Gate Type (VG-Type) 3-D NAND

  • Author

    Teng-Hao Yeh ; Chen-Jun Wu ; Chih-Wei Hu ; Wei-Chen Chen ; Hang-Ting Lue ; Yen-Hao Shih ; Ya-Chin King ; Chih-Yuan Lu

  • Author_Institution
    Macronix Int. Co., Ltd., Hsinchu, Taiwan
  • Volume
    36
  • Issue
    4
  • fYear
    2015
  • fDate
    Apr-15
  • Firstpage
    330
  • Lastpage
    332
  • Abstract
    The 3-D NAND flash is a path to achieve the highest density and the lowest cost of solid-state nonvolatile memory. Vertical gate type 3-D NAND, one of the 3-D NAND flash memories, has the smallest cell footprint (4F2). We had previously proposed a split page design for selecting NAND strings that incurs an array overhead. In this letter, we propose a new decoding method, using two stagger select string lines to select each NAND string. It greatly reduces the overhead and thus improves efficiency. The array block efficiency after improvement is close to that of conventional 2-D NAND (~ 80 %).
  • Keywords
    NAND circuits; decoding; flash memories; random-access storage; 2D NAND; VG-type 3D NAND flash memory; array block efficiency; solid-state nonvolatile memory; string decoding scheme; vertical gate type 3D NAND flash memory; Arrays; Decoding; Flash memories; Logic gates; Performance evaluation; Programming; Three-dimensional displays; NAND decoding; VG-type 3D NAND; array block efficiency;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2399107
  • Filename
    7029055