• DocumentCode
    456541
  • Title

    An XP Inspired Test-Oriented Life-Cycle Production Strategy for Building Embedded Biomedical Applications

  • Author

    Miller, James ; Smith, Michael ; Daenick, Steve ; Chen, Jingwen ; Qiao, Juan ; Huang, Fang ; Kwan, Andrew ; Roper, Marc

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta.
  • fYear
    2006
  • fDate
    29-31 Aug. 2006
  • Firstpage
    95
  • Lastpage
    106
  • Abstract
    The construction of embedded biomedical applications is an under explored topic. The status quo is for practitioners to utilize a production process which possesses no specific focus; meanwhile, the marketplace requires highly demanding characteristics from these products. The principal requirement is that most of these products need to be effectively defect free. This demands that the production process be directed towards this objective; and hence the focus of this paper is our initial attempts at designing and implementing such a process. Our new process is developed around transforming a subset of extreme programming from the world of desktop applications into a methodology for this new domain. The paper also discusses our experiences in developing test frameworks to support the domain and our objectives. Finally, the paper provides some pointers on our future plans for tackling the many unresolved issues that still exist in attempting to fully realize and support this new development process
  • Keywords
    biomedical equipment; embedded systems; medical computing; program testing; programming; software fault tolerance; software prototyping; XP inspired test-oriented life-cycle production strategy; desktop application; embedded biomedical application; extreme programming; test framework development; Application software; Biomedical computing; Biomedical engineering; Biomedical monitoring; Embedded system; Heart rate measurement; Life testing; Patient monitoring; Production; Remote monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Testing: Academic and Industrial Conference - Practice And Research Techniques, 2006. TAIC PART 2006. Proceedings
  • Conference_Location
    Windsor
  • Print_ISBN
    0-7695-2672-1
  • Type

    conf

  • DOI
    10.1109/TAIC-PART.2006.2
  • Filename
    1691675