• DocumentCode
    456932
  • Title

    Concurrent Stereo under Photometric Image Distortions

  • Author

    Gimel´farb, Georgy ; Jiang Liu ; Morris, John ; Delmas, Patrice

  • Author_Institution
    Dept. of Comput. Sci., Auckland Univ.
  • Volume
    1
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    111
  • Lastpage
    114
  • Abstract
    We have improved our concurrent stereo matching (CSM) algorithm, which abandons the search for ´best´ matches and determine matches that lie within admissible ranges using a noise model. We estimate photometric deviations between corresponding regions of stereo pairs with photometric transformations and mismatched or occluded regions. We allow for global, disparity dependent contrast and offset (gain and dark noise) distortions as well as multiple outliers. Noise is estimated for each pixel at each disparity level and the CSM framework applied. Outliers are eliminated with a statistical model and likely matching volumes identified. Then, starting in the foreground, the volumes are explored to select mutually consistent optical surfaces. Finally, local, not global, surface continuity and visibility constraints are applied to generate a disparity map. This approach compares well with other matching algorithms: the more realistic matching model allows for signal contrast and offset variations over the whole image
  • Keywords
    image matching; statistical analysis; stereo image processing; concurrent stereo matching; dark noise distortions; disparity dependent contrast; disparity map; noise estimation; occluded regions; optical surfaces; outliers; photometric deviation estimation; photometric image distortions; photometric transformation; statistical model; stereo pairs; surface continuity; visibility constraints; Belief propagation; Image reconstruction; Noise level; Optical distortion; Optical noise; Optical scattering; Optical variables control; Photometry; Signal processing; Surface reconstruction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2521-0
  • Type

    conf

  • DOI
    10.1109/ICPR.2006.401
  • Filename
    1698845