• DocumentCode
    457396
  • Title

    Predicting the benefit of sample size extension in multiclass k-NN classification

  • Author

    Kier, Christian ; Aach, Til

  • Author_Institution
    Inst. for Signal Process., Luebeck Univ.
  • Volume
    3
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    332
  • Lastpage
    335
  • Abstract
    In industrial quality inspection obtaining the training data needed for classification problems is still a very costly task. Nevertheless, the classifier quality is crucial for economic success. Thus, the question whether the influence of the training data on the classification error has been fully exploited and enough data has been obtained is very important. This paper introduces a method to answer this question for a specific problem. To be able to make a concrete statement and not only general recommendations, we focus on the k-NN classifier, since it is widely used in industrial implementations. The method is tested on four different multiclass problems: original data from an optical media inspection problem, the MNIST database, and two artificial problems with known probability densities
  • Keywords
    pattern classification; quality control; MNIST database; classification problems; economic success; industrial quality inspection; multiclass k-NN classification; optical media inspection problem; probability densities; sample size extension; training data; Computer errors; Concrete; Economic forecasting; Environmental economics; Error analysis; Industrial training; Inspection; Production; Testing; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2521-0
  • Type

    conf

  • DOI
    10.1109/ICPR.2006.942
  • Filename
    1699533