Title :
Closed-loop method to assess RF interference impact on wireless transceivers
Author :
Schaffer, Michael
Author_Institution :
Intel Corporation
Keywords :
Clocks; Degradation; Electromagnetic interference; Frequency; Noise generators; RF signals; Radiofrequency interference; Signal generators; Transceivers; Wireless sensor networks;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706287