DocumentCode :
457617
Title :
Quantifying electric and magnetic field coupling from integrated circuits with TEM cell measurements
Author :
Kasturi, V. ; Deng, S. ; Hubing, T. ; Beetner, D.
Author_Institution :
University of Missouri-Rolla
Volume :
2
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
422
Lastpage :
425
Keywords :
Coupling circuits; Electric variables measurement; Electromagnetic compatibility; Electromagnetic measurements; Integrated circuit measurements; Integrated circuit packaging; Magnetic field measurement; Magnetic fields; TEM cells; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706339
Filename :
1706339
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=457617
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