Electrical Characterization of Thin Films Using Measurements of Electrical Resistivity

Author

Vanegasa A., J. ; Molina G., O.

Author_Institution

Dept. of Electr. & Electron. Eng., National Univ. of Colombia, Bogota

Volume

1

fYear

2006

fDate

Sept. 2006

Firstpage

209

Lastpage

214

Abstract

Some procedures carried out in the National University of Colombia physics laboratories involved in the electrical characterization of thin films are highly troublesome and comprise several inaccuracies in the measurements that expose the results to misunderstandings. The following electrical characterization system is a real-time software-controlled data acquisition environment specially designed for the measurement of voltage and current in thin films using the four-probe testing method. The system also allows the study of the thermal behavior of thin films using a heating source and provides measurements storage in a plain-text archive for further research

Keywords

data acquisition; electric current measurement; electrical resistivity; materials testing; physics computing; thin films; voltage measurement; current measurement; electrical characterization; electrical resistivity; four-probe testing method; heating source; plain-text archive; real-time software-controlled data acquisition environment; thermal behavior; thin films; voltage measurement; Current measurement; Data acquisition; Electric resistance; Electric variables measurement; Laboratories; Physics; Real time systems; Software testing; Transistors; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Robotics and Automotive Mechanics Conference, 2006

Conference_Location

Cuernavaca

Print_ISBN

0-7695-2569-5

Type

conf

DOI

10.1109/CERMA.2006.41

Filename

4019739