Interaction of Light with Si Nanowire Films

Author

Tsakalakos, Loucas ; Balch, Joleyn ; Fronheiser, Jody ; Shih, Min Yi ; LeBoeuf, Stephen F. ; Pietrzykowski, Matthew ; Codella, Peter J. ; Sulima, Oleg ; Rand, Jim ; Kumar, Anil D. ; Korevaar, Bas A.

Author_Institution

Gen. Electr., Global Res. Center, Niskayuna, NY

Volume

1

fYear

2006

fDate

38838

Firstpage

111

Lastpage

113

Abstract

The optical properties of silicon nanowire films fabricated on bulk Si and glass substrates are reported. The total reflectance of aligned nanowire arrays formed by a wet etch process on bulk Si is lower than the control over all wavelengths below the bandgap, varying from ~1% at 300 nm to les 10% at 1,000 nm. Similar results are observed for nanowire thin films. The observed reflectance is related to the so-called "moth-eye" effect. Modeling work shows strong resonance of light within and between nanowires

Keywords

elemental semiconductors; etching; infrared spectra; nanotechnology; nanowires; semiconductor thin films; silicon; ultraviolet spectra; 1000 nm; 300 nm; Na₂O-CaO-SiO₂; Si; infrared spectra; moth-eye effect; nanowire arrays; optical properties; silicon nanowire films fabrication; silicon substrates; soda-lime glass substrates; ultraviolet spectra; wet etch process; Dielectric substrates; Glass; Nanobioscience; Nanoscale devices; Optical films; Reflectivity; Semiconductor films; Silicon; Solids; Wet etching;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on

Conference_Location

Waikoloa, HI

Print_ISBN

1-4244-0017-1

Electronic_ISBN

1-4244-0017-1

Type

conf

DOI

10.1109/WCPEC.2006.279376

Filename

4059574