DocumentCode
460679
Title
Study of Differential Evolution on ATPG
Author
Chuanpei, Xu ; Zhi, Li ; Wei, Mo
Author_Institution
Dept. of Electron. Eng., Guilin Univ. of Electron. Technol.
Volume
3
fYear
2006
fDate
25-28 June 2006
Firstpage
2084
Lastpage
2087
Abstract
As a new heuristic approach, differential evolution has shown superior performance in continuous space capable of handling nondifferentiable, nonlinear and multimodal objective functions. This paper reports a study of DE to operate on discrete binary variables, which are test patterns of sequential circuits. Preliminary experimental results of automatic test pattern generation (ATPG) for sequential circuits based on DE are provided and comparisons are discussed
Keywords
automatic test pattern generation; circuit testing; sequential circuits; ATPG; automatic test pattern generation; differential evolution; discrete binary variables; sequential circuits; Automatic test pattern generation; Circuit testing; Concurrent computing; Equations; Evolutionary computation; Genetic algorithms; Genetic mutations; Sequential analysis; Sequential circuits; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location
Guilin
Print_ISBN
0-7803-9584-0
Electronic_ISBN
0-7803-9585-9
Type
conf
DOI
10.1109/ICCCAS.2006.284909
Filename
4064315
Link To Document