Title :
Computer Simulation of the Dependence of Trapatt Oscillations and Their Noise Spectrum on the Minority Saturation Currents
Author :
Wierich, Reinhard L.
Author_Institution :
University College London
Keywords :
Charge carrier density; Computer simulation; Diodes; Educational institutions; Frequency; Phase noise; Plasma simulation; Plasma waves; Stochastic resonance; Voltage;
Conference_Titel :
Microwave Conference, 1971. 2nd European
Conference_Location :
Stockholm, Sweden
DOI :
10.1109/EUMA.1971.331437
