Title :
Aspects on Noise in Baritt Diodes
Author :
Sjölund, Anders ; Sellberg, Florian
Author_Institution :
Microwave Institute Foundation, Stockholm, Sweden
Keywords :
Current density; Density measurement; Diodes; Doping; Electrical resistance measurement; Gallium arsenide; Length measurement; Noise figure; Noise measurement; Silicon;
Conference_Titel :
Microwave Conference, 1973. 3rd European
Conference_Location :
Brussels, Belgium
DOI :
10.1109/EUMA.1973.331603