DocumentCode
462413
Title
Bus-Invert Coding For Low Noise 2eSST VME64x Block Transfers
Author
Aloisio, Alberto ; Branchini, Paolo ; Cevenini, Francesco ; Giordano, Raffaele ; Izzo, Vincenzo ; Loffredo, Salvatore
Author_Institution
I.N.F.N. Sezione di Napoli
Volume
2
fYear
2006
fDate
Oct. 29 2006-Nov. 1 2006
Firstpage
744
Lastpage
751
Abstract
The VME64x standard defines a double edge source synchronous block transfer (2eSST) capable to sustain a data transfer rate up to 320 MByte/s on the VMEbus. This level of performance is achieved by double edge clocking a 64-bit bus with bursts of data strobe pulses. The switching activity of such a wide bus on a shared backplane challenges the signal integrity and the data transfer reliability. The Bus-Invert is a well known coding technique developed to lower the peak power dissipation in I/O busses by decreasing their switching activity. It has been originally proposed for lowering the power consumption of CMOS VLSI devices and so reducing the on-chip line coupling and noise. In this paper we discuss how the Bus-Invert coding can be applied to improve the 2eSST performance. A custom designed board-set has been used to characterize jitter, noise and power consumption with different data patterns, coding schemes and bus loading conditions. The hardware overheads introduced by the encoding algorithm is discussed in the view of deployments in low-latency, real-time applications.
Keywords
data acquisition; optical backplanes; system buses; CMOS VLSI devices; I/O busses; VMEbus; bus loading; bus-invert coding; data acquisition systems; data patterns; data transfer rate; data transfer reliability; double edge clocking; double edge source synchronous block transfer; low noise 2eSST VME64x block transfers; onchip line coupling; peak power dissipation; power consumption; signal integrity; switching activity; ANSI standards; Backplanes; Bandwidth; Clocks; Crosstalk; Energy consumption; Jitter; Master-slave; Propagation delay; Timing; 2eSST; Bus-Invert coding; Data Acquisition Systems; Jitter; Low Power; Signal Integrity;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location
San Diego, CA
ISSN
1095-7863
Print_ISBN
1-4244-0560-2
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2006.355961
Filename
4179115
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