• DocumentCode
    463292
  • Title

    A Fundamental Failure Mechanism in Thin Film Metal-Dielectric Structures Observable as a Generated Voltage

  • Author

    Wortman, J.J. ; Burger, R.M.

  • Author_Institution
    Research Triangle Institute, Durham, North Carolina
  • fYear
    1963
  • fDate
    Sept. 1963
  • Firstpage
    173
  • Lastpage
    187
  • Keywords
    Atmosphere; Chemicals; Dielectric substrates; Dielectrics and electrical insulation; Electrodes; Equations; Failure analysis; Materials reliability; Transistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Failure in Electronics, 1963. Second Annual Symposium on the
  • Conference_Location
    Chicago, IL, USA
  • ISSN
    0097-2088
  • Type

    conf

  • DOI
    10.1109/IRPS.1963.362245
  • Filename
    4207596
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=463292