• DocumentCode
    464757
  • Title

    Estimation of Capacitive Crosstalk-Induced Short-Circuit Energy

  • Author

    Mondal, Mosin ; Kirolos, Sami ; Massoud, Yehia

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    897
  • Lastpage
    900
  • Abstract
    In the nanometer regime, crosstalk significantly impacts the dynamic power consumption of a chip. In this paper, we present a methodology for analyzing crosstalk-induced short-circuit power dissipation in cell-based digital designs. We introduce a new cell pre-characterization technique for facilitating the estimation of crosstalk-induced short-circuit power. Examples demonstrate that the presented methodology is three orders of magnitude faster than circuit simulators while the average error is as low as 3.5%.
  • Keywords
    crosstalk; integrated circuit design; short-circuit currents; capacitive crosstalk-induced short-circuit energy; cell pre-characterization; cell-based digital designs; dynamic power consumption; power dissipation; Capacitance; Circuit simulation; Coupling circuits; Crosstalk; Energy consumption; Integrated circuit interconnections; Noise reduction; Power dissipation; Voltage; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378070
  • Filename
    4252780