Fault Tolerance Circuit for AM-OLED

A novel circuit employing p-type low-temperature poly-Si thin-film transistors is introduced for active matrix-organic light-emitting diode (AM-OLED) circuits to automatically detect short defects and switch to a spare OLED. This design maintains the luminance of the OLED pixel without changing the driving current in the event of defects. Experimental results show that not only is fault tolerance capability obtained during operation, but also a significant amount (around 90%) of power consumption is saved compared with the standard driving circuits.