• DocumentCode
    465074
  • Title

    Dichromatic spectral measurement circuit in vanilla CMOS

  • Author

    Fasnacht, D.B. ; Delbruck, T.

  • Author_Institution
    Inst. of Neuroinformatics, UNI-ETH, Zurich
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    3091
  • Lastpage
    3094
  • Abstract
    The circuit described in this paper uses a "verta-color" stacked two-diode structure to measure relative long and short wavelength spectral content. The p-type source-drain to nwell forms the top diode and the nwell-psubstrate diode forms the bottom diode. The circuit output is a digital PWM signal whose frequency encodes absolute intensity and whose duty cycle encodes the relative photodiode current. This signal is formed by a self-timed circuit that alternately discharges the top and bottom photodiodes. This circuit was fabricated in a standard 3M 2P 0.5 mum CMOS process. Monochromatic stimulation shows that the duty cycle varies between 50% and 7% as the photon wavelength is varied between 400 nm to 750 nm. The output frequency is 150 Hz at incident irradiance of 1.7 W/m2. Chip-to-chip variation of PWM duty cycle and frequency is about 1% measured over 5 chips. Power consumption is 20 muW. A modified version of this circuit could form the basis for simple color vision sensors built in widely-available vanilla CMOS.
  • Keywords
    CMOS integrated circuits; image sensors; photodiodes; pulse width modulation; 0.5 micron; 150 Hz; 20 muW; 400 to 750 nm; CMOS process; color vision sensors; dichromatic spectral measurement circuit; digital PWM signal; monochromatic stimulation; nwell-psubstrate diode; p-type source-drain; relative photodiode current; vanilla CMOS; verta-color; CMOS process; Circuits; Diodes; Energy consumption; Fault location; Frequency measurement; Photodiodes; Pulse width modulation; Semiconductor device measurement; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378062
  • Filename
    4253332