DocumentCode
465288
Title
Non-Linear Statistical Static Timing Analysis for Non-Gaussian Variation Sources
Author
Cheng, Lerong ; Xiong, Jinjun ; He, Lei
Author_Institution
Univ. of California Los Angeles, Los Angeles
fYear
2007
fDate
4-8 June 2007
Firstpage
250
Lastpage
255
Abstract
Existing statistical static timing analysis (SSTA) techniques suffer from limited modeling capability by using a linear delay model with Gaussian distribution, or have scalability problems due to expensive operations involved to handle non-Gaussian variation sources or non-linear delays. To overcome these limitations, we propose a novel SSTA technique to handle both nonlinear delay dependency and non- Gaussian variation sources simultaneously. We develop efficient algorithms to perform all statistical atomic operations (such as max and add) efficiently via either closed- form formulas or one-dimensional lookup tables. The resulting timing quantity provably preserves the correlation with variation sources to the third-order. We prove that the complexity of our algorithm is linear in both variation sources and circuit sizes, hence our algorithm scales well for large designs. Compared to Monte Carlo simulation for non-Gaussian variation sources and nonlinear delay models, our approach predicts all timing characteristics of circuit delay with less than 2% error.
Keywords
Gaussian distribution; circuit complexity; integrated circuit design; network analysis; statistical analysis; timing; 1D lookup tables; Gaussian distribution; algorithm complexity; circuit delay; closed form formulas; large designs; linear delay model; nonGaussian variation sources; nonlinear delay dependency; nonlinear statistical static timing analysis; scalability problems; statistical atomic operations; Algorithm design and analysis; CMOS technology; Circuits; Delay effects; Delay lines; Gaussian distribution; Independent component analysis; Permission; Random variables; Timing; Algorithms; Non-Gaussian; Non-linear delay; Statistical timing; Verification;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location
San Diego, CA
ISSN
0738-100X
Print_ISBN
978-1-59593-627-1
Type
conf
Filename
4261181
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