DocumentCode
465335
Title
RIJID: Random Code Injection to Mask Power Analysis based Side Channel Attacks
Author
Ambrose, Jude Angelo ; Ragel, Roshan G. ; Parameswaran, Sri
Author_Institution
Univ. of New South Wales, Sydney
fYear
2007
fDate
4-8 June 2007
Firstpage
489
Lastpage
492
Abstract
Side channel attacks are becoming a major threat to the security of embedded systems. Countermeasures proposed to overcome Simple Power Analysis (SPA) and Differential Power Analysis (DPA), are data masking, table masking, current flattening, circuitry level solutions, dummy instruction insertions and balancing bit-flips. All these techniques are either susceptible to multi-order side channel attacks, not sufficiently generic to cover all encryption algorithms, or burden the system with high area cost, run-time or energy consumption. A HW/SW based randomized instruction injection technique is proposed in this paper to overcome the pitfalls of previous countermeasures. Our technique injects random instructions at random places during the execution of an application which protects the system from both SPA and DPA. Further, we devise a systematic method to measure the security level of a power sequence and use it to measure the number of random instructions needed, to suitably confuse the adversary. Our processor model costs 1.9% in additional area for a simplescalar processor, and costs on average 29.8% in runtime and 27.1% in additional energy consumption for six industry standard cryptographic algorithms.
Keywords
cryptography; balancing bit-flips; circuitry level solutions; current flattening; data masking; differential power analysis; dummy instruction insertions; mask power analysis; random code injection; randomized instruction injection technique; side channel attacks; simple power analysis; six industry standard cryptographic algorithms; table masking; Circuits; Costs; Cryptography; Data analysis; Data security; Embedded system; Energy consumption; Power measurement; Power system security; Runtime; Cross Correlation; Design; Measurement; Pattern Matching; Power Analysis; Random Instruction Injection; Security; Side Channel Attack;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location
San Diego, CA
ISSN
0738-100X
Print_ISBN
978-1-59593-627-1
Type
conf
Filename
4261233
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