• DocumentCode
    465366
  • Title

    A Robust Protocol for Concurrent On-Line Test (COLT) of NoC-based Systems-on-a-Chip

  • Author

    Bhojwani, Praveen S. ; Mahapatra, Rabi N.

  • Author_Institution
    Texas A&M Univ., College Station
  • fYear
    2007
  • fDate
    4-8 June 2007
  • Firstpage
    670
  • Lastpage
    675
  • Abstract
    Concurrent on-line testing (COLT) of complex systems-on-a-chip (SoC) designs under lowering noise margins and degrading lifetimes of on-chip components, provides the ideal solution for the monitoring of system health while managing intrusion into executing applications. Deploying test infrastructure-IPs (TI-IPs) into designs has demonstrated the feasibility of using COLT in SoCs. Identifying potential hazards and ensuring correct operation of COLT is critical to providing reliable health monitoring. With the emergence of networks-on-a-chip (NoC) as communication infrastructures not only suitable for application related on-chip communication, but also test access mechanisms to on-chip cores, the experimental setup in this research, deploys TI-IP in a NoC environment and demonstrates TI-IP operation, its communication protocol specification and other related costs.
  • Keywords
    condition monitoring; integrated circuit testing; network-on-chip; NoC; SoC; concurrent on-line test; health monitoring; networks-on-a-chip; on-chip components; system health; systems-on-a-chip; test infrastructure-IP; Degradation; Disaster management; Hazards; Life testing; Monitoring; Network-on-a-chip; Noise robustness; Protocols; System testing; System-on-a-chip; Concurrent on-line testing; Design; Management; Performance; Reliability; Verification; network-on-chip; robust protocol;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-59593-627-1
  • Type

    conf

  • Filename
    4261268