DocumentCode
465394
Title
Gate Sizing For Cell Library-Based Designs
Author
Hu, Shiyan ; Ketkar, Mahesh ; Hu, Jiang
Author_Institution
Texas A&M Univ., College Station
fYear
2007
fDate
4-8 June 2007
Firstpage
847
Lastpage
852
Abstract
With increasing time-to-market pressure and shortening semiconductor product cycles, more and more chips are being designed with library-based methodologies. In spite of this shift, the problem of discrete gate sizing has received significantly less attention than its continuous counterpart. On the other hand, cell sizes of many realistic libraries are sparse, for example, geometrically spaced, which makes the nearest rounding approach inapplicable as large timing violations may be introduced. Therefore, it is highly desirable to design an effective algorithm to handle this discrete gate sizing problem. Such an algorithm is proposed in this paper. The algorithm is a continuous solution guided dynamic programming approach. A set of novel techniques, such as locality sensitive hashing based solution selection and stage pruning, are also proposed to accelerate the algorithm and improve the solution quality. Our experimental results demonstrate that (1) nearest rounding approach often leads to large timing violations and (2) compared to the well-known Coudert´s approach, the new algorithm saves 9% - 31% in area cost while still satisfying the timing constraint.
Keywords
cryptography; digital libraries; dynamic programming; time to market; cell library-based designs; discrete gate sizing; dynamic programming gate approach; gate sizing; library-based methodologies; locality sensitive hashing based solution selection; rounding approach; stage pruning; time-to-market pressure; Acceleration; Algorithm design and analysis; Costs; Design automation; Design methodology; Dynamic programming; Libraries; Permission; Time to market; Timing; Algorithms; Design; Dynamic Programming; Gate Sizing; Performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location
San Diego, CA
ISSN
0738-100X
Print_ISBN
978-1-59593-627-1
Type
conf
Filename
4261301
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