DocumentCode :
468673
Title :
Improved voltage disturbance generator for the performance test of the custom power devices
Author :
Lee, Young-Ho ; Park, Hae-Young ; Nho, Eui-Cheol ; Kim, In-Dong ; Chun, Tae-Won ; Kim, Heung-Geun ; Choi, Nam-Sup
Author_Institution :
Pukyong Nat. Univ., Busan
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
175
Lastpage :
179
Abstract :
An improved voltage disturbance generator is proposed. To test the performance of the custom power devices such as DVR, SSTS, dynamic UPS, etc., a voltage disturbance generator is necessary. The proposed generator has good features of high reliability, low cost, simple structure, high efficiency, and reduced voltage drop. The main switching device is SCR thyristor, and all the thyristors have natural commutation characteristics, which provides reliable system. The circuit analysis and operating principle of the proposed scheme are described in each mode of voltage sag, swell, outage, and unbalance. Simulation and experimental results show the usefulness of the proposed scheme.
Keywords :
network analysis; power supply quality; thyristors; SCR thyristor; circuit analysis; custom power devices; reduced voltage drop; reliability; voltage disturbance generator; Automation; Circuit simulation; Costs; Electronic equipment; Power generation; Switches; Testing; Thyristors; Uninterruptible power systems; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Machines and Systems, 2007. ICEMS. International Conference on
Conference_Location :
Seoul
Print_ISBN :
978-89-86510-07-2
Electronic_ISBN :
978-89-86510-07-2
Type :
conf
Filename :
4412164
Link To Document :
بازگشت