DocumentCode
468673
Title
Improved voltage disturbance generator for the performance test of the custom power devices
Author
Lee, Young-Ho ; Park, Hae-Young ; Nho, Eui-Cheol ; Kim, In-Dong ; Chun, Tae-Won ; Kim, Heung-Geun ; Choi, Nam-Sup
Author_Institution
Pukyong Nat. Univ., Busan
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
175
Lastpage
179
Abstract
An improved voltage disturbance generator is proposed. To test the performance of the custom power devices such as DVR, SSTS, dynamic UPS, etc., a voltage disturbance generator is necessary. The proposed generator has good features of high reliability, low cost, simple structure, high efficiency, and reduced voltage drop. The main switching device is SCR thyristor, and all the thyristors have natural commutation characteristics, which provides reliable system. The circuit analysis and operating principle of the proposed scheme are described in each mode of voltage sag, swell, outage, and unbalance. Simulation and experimental results show the usefulness of the proposed scheme.
Keywords
network analysis; power supply quality; thyristors; SCR thyristor; circuit analysis; custom power devices; reduced voltage drop; reliability; voltage disturbance generator; Automation; Circuit simulation; Costs; Electronic equipment; Power generation; Switches; Testing; Thyristors; Uninterruptible power systems; Voltage fluctuations;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Machines and Systems, 2007. ICEMS. International Conference on
Conference_Location
Seoul
Print_ISBN
978-89-86510-07-2
Electronic_ISBN
978-89-86510-07-2
Type
conf
Filename
4412164
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