• DocumentCode
    468673
  • Title

    Improved voltage disturbance generator for the performance test of the custom power devices

  • Author

    Lee, Young-Ho ; Park, Hae-Young ; Nho, Eui-Cheol ; Kim, In-Dong ; Chun, Tae-Won ; Kim, Heung-Geun ; Choi, Nam-Sup

  • Author_Institution
    Pukyong Nat. Univ., Busan
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    175
  • Lastpage
    179
  • Abstract
    An improved voltage disturbance generator is proposed. To test the performance of the custom power devices such as DVR, SSTS, dynamic UPS, etc., a voltage disturbance generator is necessary. The proposed generator has good features of high reliability, low cost, simple structure, high efficiency, and reduced voltage drop. The main switching device is SCR thyristor, and all the thyristors have natural commutation characteristics, which provides reliable system. The circuit analysis and operating principle of the proposed scheme are described in each mode of voltage sag, swell, outage, and unbalance. Simulation and experimental results show the usefulness of the proposed scheme.
  • Keywords
    network analysis; power supply quality; thyristors; SCR thyristor; circuit analysis; custom power devices; reduced voltage drop; reliability; voltage disturbance generator; Automation; Circuit simulation; Costs; Electronic equipment; Power generation; Switches; Testing; Thyristors; Uninterruptible power systems; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems, 2007. ICEMS. International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-89-86510-07-2
  • Electronic_ISBN
    978-89-86510-07-2
  • Type

    conf

  • Filename
    4412164