• DocumentCode
    468807
  • Title

    Modeling inter-turn winding faults in switched reluctance machines based on neural network

  • Author

    Lu, Shengli ; Chen, Hao ; Chen, Zhe

  • Author_Institution
    China Univ. of Min. & Technol., Xuzhou
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    1600
  • Lastpage
    1605
  • Abstract
    This paper presents a new method for modeling inter-turn winding faults in switched reluctance machine (SRM) based on artificial neural network (ANN) , incorporating a simple analytical method to estimate the flux-linkage characteristics of SRM under winding faults. SRM has been proposed for use in applications requiring certain fault tolerance. It is important to distinguish and characterize the inter-turn winding faults in SRM for maintenance and diagnostic purposes. In order to build an accurate model of SRM with and without faults, the effective magnetic equivalent circuit method is used to calculate the nonlinear flux-linkage characteristics under various winding fault conditions. ANN is applied for its well-known interpolation capabilities for the highly nonlinear SRM, with phase current, rotor position and a fault condition parameter as inputs and flux-linkage as output. Then, the dynamic models for the SRM with inter-turn winding faults are constructed. The analysis of the results from the faulty machine under different control strategies is presented and verifies the good performance of the developed method.
  • Keywords
    electric machine analysis computing; fault tolerance; neural nets; reluctance machines; artificial neural network; fault tolerance; interturn winding faults; switched reluctance machines; Artificial neural networks; Circuit faults; Equivalent circuits; Fault tolerance; Machine windings; Magnetic analysis; Neural networks; Nonlinear dynamical systems; Reluctance machines; Reluctance motors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems, 2007. ICEMS. International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-89-86510-07-2
  • Electronic_ISBN
    978-89-86510-07-2
  • Type

    conf

  • Filename
    4412298