• DocumentCode
    468872
  • Title

    Leakage Reduction in Sub-100nm CMOS Technologies: Bridging the Gap Between Technology, Circuit Design and Low Power Product Requirements

  • Author

    Pacha, Christian ; Berthold, Jörg

  • Author_Institution
    Infineon Technol., Munich
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    645
  • Lastpage
    645
  • Abstract
    With the introduction of the 130nm and 90nm CMOS technology nodes leakage reduction techniques became an essential topic of circuit and system design to meet product requirements, especially in the fields of portable applications. At the same time, a diversification into CMOS technology platforms for low standby power applications, so-called generic CMOS platforms, and high performance CMOS technologies for high-speed microprocessors is observed.
  • Keywords
    CMOS integrated circuits; integrated circuit design; nanotechnology; CMOS integrated circuits; integrated circuit design; leakage reduction; nanotechnology; size 130 nm; size 90 nm; CMOS logic circuits; CMOS technology; Circuit synthesis; Circuits and systems; GSM; Mobile handsets; Multimedia systems; Personal digital assistants; Product design; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4419024
  • Filename
    4419024