DocumentCode
468872
Title
Leakage Reduction in Sub-100nm CMOS Technologies: Bridging the Gap Between Technology, Circuit Design and Low Power Product Requirements
Author
Pacha, Christian ; Berthold, Jörg
Author_Institution
Infineon Technol., Munich
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
645
Lastpage
645
Abstract
With the introduction of the 130nm and 90nm CMOS technology nodes leakage reduction techniques became an essential topic of circuit and system design to meet product requirements, especially in the fields of portable applications. At the same time, a diversification into CMOS technology platforms for low standby power applications, so-called generic CMOS platforms, and high performance CMOS technologies for high-speed microprocessors is observed.
Keywords
CMOS integrated circuits; integrated circuit design; nanotechnology; CMOS integrated circuits; integrated circuit design; leakage reduction; nanotechnology; size 130 nm; size 90 nm; CMOS logic circuits; CMOS technology; Circuit synthesis; Circuits and systems; GSM; Mobile handsets; Multimedia systems; Personal digital assistants; Product design; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-1507-6
Electronic_ISBN
978-1-4244-1508-3
Type
conf
DOI
10.1109/IEDM.2007.4419024
Filename
4419024
Link To Document