Title :
Looking Beyond Silicon - A Pipe Dream or the Inevitable Next Step?
Author :
Antoniadis, Dimitri
Author_Institution :
Massachusetts Institute of Technology
Keywords :
CMOS logic circuits; CMOS technology; Capacitive sensors; FETs; High K dielectric materials; High-K gate dielectrics; III-V semiconductor materials; Impedance; Scalability; Silicon;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4419026
