• DocumentCode
    469702
  • Title

    Mesh model based projection operator for emission tomography

  • Author

    Delgado, Ricard Gonzalo ; Brankov, Jovan G.

  • Author_Institution
    Illinois Inst. of Technol., Chicago
  • Volume
    4
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    2760
  • Lastpage
    2763
  • Abstract
    In this paper, we presented a framework for calculation of a projection operator for emission tomographic reconstruction, using content-adaptive mesh model (CAMM) for image representation, which can incorporate major image degradation models, namely attenuation and parallel hole collimator response. The CAMM is an efficient image description based on non-uniform sampling and linear interpolation. The data acquisition process, e.g. forward projection, is calculated using a ray-casting algorithm. We tested, successfully, the proposed projection operator model using a simulation and a maximum-likelihood expectation maximization reconstruction algorithm. The research described in this paper establishes a methodology for future development of 4D (deformable) CAMM reconstruction.
  • Keywords
    data acquisition; emission tomography; image reconstruction; image representation; image sampling; maximum likelihood estimation; medical image processing; mesh generation; optimisation; 4D CAMM reconstruction; content-adaptive mesh model; data acquisition; emission tomographic reconstruction; emission tomography; forward projection; image degradation models; image description; image representation; linear interpolation; maximum-likelihood expectation maximization; mesh model; nonuniform sampling; parallel hole collimator; projection operator; projection operator model; ray-casting algorithm; Attenuation; Collimators; Data acquisition; Degradation; Image reconstruction; Image representation; Image sampling; Interpolation; Testing; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4436713
  • Filename
    4436713