• DocumentCode
    469840
  • Title

    Acceleration of GATE SPECT simulations

  • Author

    De Beenhouwer, Jan ; Staelens, Steven ; Vandenberghe, Stefaan ; Lemahieu, Ignace

  • Author_Institution
    Ghent Univ., Ghent
  • Volume
    5
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    3649
  • Lastpage
    3655
  • Abstract
    GEANT4 application for tomographic emission (GATE) is a geometry and tracking 4 (GEANT4) application toolkit for accurate simulation of positron emission tomography (PET) and single photon emission computed tomography (SPECT) scanners. GATE simulations with realistic count levels are very CPU-intensive as they take up to several days with single-CPU computers. Therefore, we implemented both standard (FD) and convolution based forced detection (CFD) with multiple projection sampling (MPS) which allows the simulation of all projections simultaneously in GATE. In addition, a FD and CFD specialized Geant4 navigator was developed to overcome the detailed but slow tracking algorithms in Geant4. This paper is focussed on the implementation and validation of these aforementioned developments. The results show a good agreement between the FD and CFD versus analog GATE simulations. These combined developments accelerate GATE from three to six orders of magnitude and render realistic simulations feasible within clinically acceptable simulation times.
  • Keywords
    Monte Carlo methods; convolution; positron emission tomography; single photon emission computed tomography; GATE SPECT simulations; GEANT4; PET; convolution; forced detection; multiple projection sampling; positron emission tomography; single photon emission computed tomography; Acceleration; Application software; Computational fluid dynamics; Computational geometry; Computational modeling; Computer simulation; Convolution; Positron emission tomography; Single photon emission computed tomography; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4436913
  • Filename
    4436913