• DocumentCode
    469995
  • Title

    Cylindrical silicon-on-insulator microdosimeter: Design, fabrication and TCAD modeling

  • Author

    Lim, W.H. ; Ziebell, A.L. ; Cornelius, I. ; Reinhard, M.I. ; Prokopovich, D.A. ; Dzurak, A.S. ; Rosenfeld, A.B.

  • Author_Institution
    Univ. of New South Wales, Kensington
  • Volume
    2
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    1633
  • Lastpage
    1636
  • Abstract
    This work presents a new generation silicon-on- insulator (SOI)microdosimeter device . This new device was designed and fabricated using planar processing techniques to produce a micrometer sized cylindrical shaped, well defined microdosimeter sensitive volume. Cylindrical structures were employed to allow for a better definition of the average chord length of the sensitive volume compared to the previous elongated parallelepiped solid state designs. The structures were manufactured on individual mesas situated on top of a buried oxide insulating layer. These mesa designs eliminated lateral charge diffusion. Two kinds of test structures were designed with sensitive region widths of 2 mum and 10 mum. ISE TCAD modeling of the electrostatic potential and electric field profile of the cylindrical microdosimeter were carried out to obtain 3D potential and electric field profiles. The modeling found that as expected a radial electric field was established across the cylindrical shaped sensitive volume. The modeling also found it was possible to increase the reverse bias voltage to a point where internal amplification of event signals was obtained. This is important finding for the measurements of low linear energy transfer (LET) events.
  • Keywords
    dosimetry; silicon radiation detectors; TCAD modeling; cylindrical microdosimeter; electric field profile; electrostatic potential; linear energy transfer events; planar processing techniques; silicon-on-insulator microdosimeter device; Electric potential; Electrostatics; Energy measurement; Fabrication; Insulation; Manufacturing; Silicon on insulator technology; Solid state circuits; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4437312
  • Filename
    4437312