DocumentCode
470010
Title
Microradiographic observation of grainy structure of Al-alloy
Author
Vavrik, Daniel ; Holy, Tomas ; Jakubek, Jan ; Jakubek, Martin ; Valach, Jaroslav
Author_Institution
Czech Acad. of Sci., Prague
Volume
2
fYear
2007
fDate
Oct. 26 2007-Nov. 3 2007
Firstpage
1711
Lastpage
1715
Abstract
Studies concerning the functionality and integrity of components require information about microstructure and related mechanical behavior of the material used. Material microstructure is standardly observed optically or by scanning electron microscope, mechanical behavior is usually measured by some optical method. One promising solution how to observe material microstructure and its mechanical behavior simultaneously is utilizing the mu-radiographic technique. This possibility is demonstrated in non-homogenous distribution of Cooper in individual grains of Al-alloy which is manifested by characteristic patterns in mu-radiograms. The measurement of the displacement field requires certain marks which can be followed as moving objects during loading. Radiographic studies of mechanical behavior of alloys can benefit from their natural microstructure which can be utilized as natural mark fields. The employed table-scale experimental system includes the advantage of simplicity of use and low cost operation compared to those of synchrotron facilities, which are currently used for this kind of studies.
Keywords
aluminium alloys; copper alloys; crystal microstructure; radiography; scanning electron microscopy; AlCuJk; grainy structure; mechanical behavior; microradiography; microstructure; mu-radiograms; mu-radiographic technique; nonhomogenous Cooper distribution; optical method; scanning electron microscopy; table-scale experimental system; Costs; Displacement measurement; Electron optics; Mechanical variables measurement; Microstructure; Optical materials; Optical microscopy; Radiography; Scanning electron microscopy; Synchrotrons;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location
Honolulu, HI
ISSN
1095-7863
Print_ISBN
978-1-4244-0922-8
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2007.4437330
Filename
4437330
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