Introducing a Bypass-Backup Connection System for Current-Mode Copper Electrowinning Intercell Bars

Author

Wiechmann, Eduardo P. ; Munoz, Luis G. ; Aqueveque, Pablo E. ; Vidal, Guillermo A. ; Henriquez, Jorge A.

Author_Institution

Dept. de Ing. Electr., Univ. de Concepcion, Concepcion, Chile

Volume

50

Issue

2

fYear

2014

fDate

March-April 2014

Firstpage

1490

Lastpage

1495

Abstract

The proposed system is suitable for current-mode segmented intercell bars. Previous developments show that these bars provide protection against short circuits but are sensitive to open circuits and dirt contacts. This new system adds segmented sidebars to interconnect in groups the otherwise electrically insulated cathode and anode hanger ends. The combination of a segmented main bar with these sidebars offers protection against short circuits, open circuits, and impaired contacts.

Keywords

anodes; busbars; cathodes; conductors (electric); copper; electrical contacts; electrowinning; short-circuit currents; anode hanger ends; busbars; bypass-backup connection system; current-mode copper electrowinning intercell bars; dirt contacts; electrically insulated cathode; impaired contacts; open circuits; short circuits; sidebars; Anodes; Bars; Cathodes; Contacts; Copper; Current density; Busbars; copper electrowinning; electrical connection; energy efficiency;

fLanguage

English

Journal_Title

Industry Applications, IEEE Transactions on

Publisher

ieee

ISSN

0093-9994

Type

jour

DOI

10.1109/TIA.2013.2273752

Filename

6562751