Title :
Introducing a Bypass-Backup Connection System for Current-Mode Copper Electrowinning Intercell Bars
Author :
Wiechmann, Eduardo P. ; Munoz, Luis G. ; Aqueveque, Pablo E. ; Vidal, Guillermo A. ; Henriquez, Jorge A.
Author_Institution :
Dept. de Ing. Electr., Univ. de Concepcion, Concepcion, Chile
Abstract :
The proposed system is suitable for current-mode segmented intercell bars. Previous developments show that these bars provide protection against short circuits but are sensitive to open circuits and dirt contacts. This new system adds segmented sidebars to interconnect in groups the otherwise electrically insulated cathode and anode hanger ends. The combination of a segmented main bar with these sidebars offers protection against short circuits, open circuits, and impaired contacts.
Keywords :
anodes; busbars; cathodes; conductors (electric); copper; electrical contacts; electrowinning; short-circuit currents; anode hanger ends; busbars; bypass-backup connection system; current-mode copper electrowinning intercell bars; dirt contacts; electrically insulated cathode; impaired contacts; open circuits; short circuits; sidebars; Anodes; Bars; Cathodes; Contacts; Copper; Current density; Busbars; copper electrowinning; electrical connection; energy efficiency;
Journal_Title :
Industry Applications, IEEE Transactions on
DOI :
10.1109/TIA.2013.2273752