• DocumentCode
    470449
  • Title

    Electron beam projection nanopatterning using crystal lattice images obtained from high resolution transmission electron microscopy

  • Author

    Lee, H.-S. ; Kim, B.-S. ; Kim, H.-M. ; Wi, J.-S. ; Nam, S.-W. ; Kim, K.-B. ; Arai, Y.

  • Author_Institution
    Seoul Nat. Univ., Seoul
  • fYear
    2007
  • fDate
    5-8 Nov. 2007
  • Firstpage
    418
  • Lastpage
    419
  • Abstract
    The fabrication of nanometer-scale features such as quantum dots and quantum wires, in a controllable and economically viable manner is one of essential requirements for the production of highly functional devices. Here, we propose a new electron beam projection lithography technique for patterning nanometer scale, periodic structures. The novelty of this technique is that the crystalline lattice image observed by high resolution transmission electron microscopy (HRTEM) is employed as the ultimate mask to define nanometer scale pattern. Namely, the Angstrom-scale lattice image of a crystalline material is magnified within the electron microscope, and is projected onto an electron-beam-resist-coated substrate. This technique is tentatively called AIPEL (atomic image projection electron-beam lithography).
  • Keywords
    electron beam lithography; nanolithography; nanopatterning; periodic structures; transmission electron microscopy; AIPEL; Angstrom-scale lattice image; atomic image projection electron-beam lithography; crystal lattice images; crystalline material; electron beam projection lithography technique; electron microscope; electron-beam-resist-coated substrate; high resolution transmission electron microscopy; nanometer scale pattern; nanometer scale periodic structures; nanopatterning; quantum dots; quantum wires; Electron beams; Fabrication; Image resolution; Lattices; Lithography; Nanopatterning; Nanoscale devices; Quantum dots; Transmission electron microscopy; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology, 2007 Digest of papers
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-9902472-4-9
  • Type

    conf

  • DOI
    10.1109/IMNC.2007.4456282
  • Filename
    4456282