• DocumentCode
    47106
  • Title

    A boson interaction model for electrostatic stresses

  • Author

    Minteer, Timothy M.

  • Author_Institution
    Schweitzer Eng. Labs., Inc., Pullman, WA, USA
  • Volume
    21
  • Issue
    3
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    973
  • Lastpage
    981
  • Abstract
    Maxwell´s stress equation for electrostatics identifies a tensile stress in the direction of the electric field and a pressure normal to this direction. For an isolated, spherically symmetric static charge distribution, Maxwell´s stress equation may be recast to eliminate the stress normal to the electric field and establish a stress only aligned with the electric field. The remaining stress is identified as an external omnidirectional Poincaré stress, inwardly directed towards the charge distribution. The Poincaré stress is modeled as a mean valued, continual exchange of bosons between the charge distribution and the distant matter of the universe. For two separated, spherically symmetric static charge distributions, Maxwell´s stress equation may be recast to develop a line stress that only exists on the straight path between the two charge distributions. The line stress is identified as a Coulomb stress modeled as a mean valued, continual exchange of photons back and forth between two like-charge distributions.
  • Keywords
    Maxwell equations; electric fields; exchange models; Coulomb stress; Maxwell stress equation; boson interaction model; continual boson exchange; continual photon exchange; electric field direction; electrostatic stresses; external omnidirectional Poincaré stress; line stress; spherically symmetric static charge distribution; stress elimination; tensile stress; Electrostatics; Equations; Force; Mathematical model; Photonics; Potential energy; Stress; Boson interaction; Coulombforce; Electrostatic analysis; Maxwell stress; Poincar?? stress; electric fields;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2014.6832239
  • Filename
    6832239