• DocumentCode
    471176
  • Title

    Finding the Incidence Angle for Rays Refracted Through Multiple Dielectric Layers

  • Author

    Ahmed, Y. ; Hao, Yuwen

  • Author_Institution
    London Univ., London
  • fYear
    2007
  • fDate
    11-16 Nov. 2007
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this paper we propose a technique for finding the exact angle that a ray must be transmitted in order to arrive at a particular location after refracting through a dielectric medium. The technique is initially developed for a single dielectric medium but is shown to be applicable to multiple dielectric media with various widths and permittivities. Simulation results have shown that the proposed technique performs better than the existing techniques for low loss dielectrics and for certain incidence angles.
  • Keywords
    dielectric materials; electromagnetic wave refraction; dielectric medium; multiple dielectric layers; rays incidence angle; Ray Tracing; Reflection; Refraction; Snell´s Law; Wave Propagation;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Antennas and Propagation, 2007. EuCAP 2007. The Second European Conference on
  • Conference_Location
    Edinburgh
  • Print_ISBN
    978-0-86341-842-6
  • Type

    conf

  • Filename
    4458917