• DocumentCode
    471340
  • Title

    Analysis and Design of a Continuous-Time Sigma-Delta Modulator with 20 MHz Signal Bandwidth, 53.6 dB Dynamic Range and 51.4 dB SNDR

  • Author

    Wang, Tao ; Liang, Liping

  • Author_Institution
    Tsinghua Univ., Beijing
  • fYear
    2008
  • fDate
    23-25 Jan. 2008
  • Firstpage
    79
  • Lastpage
    84
  • Abstract
    This paper presents the non-idealities analysis, modelling and circuit implementation of a second-order two-bit Continuous-Time (CT) Sigma-Delta Modulator (SDM). The non-idealities such as quantizer metastability, clock jitter, finite integrator DC gain, circuit noises and non-linearities are discussed. Discrete time (DT) SDM model is first developed and then mapped onto CT-SDM model. Finally the circuit is implemented in 130 nm CMOS technology. It achieves a simulated 53.6 dB DR and 51.4 dB SNDR over a 20MHz signal bandwidth. The sampling clock frequency is 640 MHz, producing an Over-Sampling-Ratio (OSR) of 16. Second order loop is intrinsically stable, while higher order loops tend to be unstable and much effort must be taken to maintain stability. Multi-bit internal quantizer is employed to obtain more aggressive quantization noise suppression and lower clock jitter sensitivity compared with higher order single bit structure. Spectre simulation shows that the power dissipation of the circuit is about 6 mW at 1.8 V supply.
  • Keywords
    CMOS integrated circuits; continuous time systems; sigma-delta modulation; CMOS technology; aggressive quantization noise suppression; clock jitter sensitivity; continuous-time sigma-delta modulator design; frequency 20 MHz; multibit internal quantizer; non-idealities analysis; Bandwidth; CMOS technology; Circuit noise; Clocks; Delta-sigma modulation; Dynamic range; Jitter; Semiconductor device modeling; Signal analysis; Signal design; ADC; continuous time; sigma delta; wide band;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-0-7695-3110-6
  • Type

    conf

  • DOI
    10.1109/DELTA.2008.17
  • Filename
    4459514