• DocumentCode
    471841
  • Title

    Predicting Neuropsychological Development from Skull Imaging

  • Author

    Lin, H.J. ; Ruiz-Correa, S. ; Shapiro, L.G. ; Speltz, M.L. ; Cunningham, M.L. ; Sze, R.W.

  • Author_Institution
    Dept. of Med. Educ. & Biomed. Informatics, Univ. of Washington
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    3450
  • Lastpage
    3455
  • Abstract
    Craniosynostosis is a serious and common pediatric disease caused by the premature fusion of sutures of the skull. Although studies have shown an increase in risk for cognitive deficits in patients with isolated craniosynostosis, the causal basis for this association is still unclear. It is hypothesized that an abnormally shaped skull produces a secondary deformation of the brain that results in the disruption of normal neuropsychological development. In this paper, we conduct a comparative analysis of our newly developed shape descriptors in an attempt to understand the impact of skull deformations on neurobehavior. In particular, we show that our scaphocephaly severity indices and symbolic shape signatures are predictive of mental ability and psychomotor functions, respectively, which suggests the possibility that secondary deformation could influence neuro-developmental status
  • Keywords
    biomechanics; biomedical imaging; bone; brain; cognition; diseases; neurophysiology; psychology; abnormally shaped skull; cognitive deficits; craniosynostosis; mental ability; neurobehavior; neuropsychological development; pediatric disease; premature fusion; psychomotor function; scaphocephaly severity indices; secondary brain deformation; shape descriptors; skull deformation; skull imaging; symbolic shape signature; Biomedical imaging; Cities and towns; Computed tomography; Diseases; Medical diagnostic imaging; Pediatrics; Psychology; Shape; Skull; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260321
  • Filename
    4462539