• DocumentCode
    471891
  • Title

    Normal Vector Information Registration and Comparisons with Mutual Information

  • Author

    Zhuang, Xiahai ; Gu, Lixu

  • Author_Institution
    Dept. of Comput. Sci., Shanghai Jiao Tong Univ.
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    3827
  • Lastpage
    3830
  • Abstract
    We propose a new similarity measure for medical image registration and make comparisons with two kinds of mutual information (MI) methods in the literature. This new measure is computed from the normal vector information (NVI) of the images instead of pixel intensity that the MI methods based. The NVI of an image is extracted from the relationship between pixels and computed from the normal vector of the pixel based on their local isosurface. The NVI method has been proved to be able to successfully register two-dimensional (2D) images. In this paper, we will apply it in three-dimensional (3D) medical images and employ the known-result datasets to quantitatively evaluate the performances of the NVI and MI methods. The visual assessment is employed for the unknown-result clinical image dataset registrations. The results show that the NVI method is ready to be affected by the salt-and-pepper noise; while when the random noise is removed, the NVI method performs no worse than the MI methods
  • Keywords
    feature extraction; image registration; medical image processing; random noise; clinical image dataset registration; information extraction; local isosurface; medical image registration; mutual information methods; normal vector information registration; random noise; salt-and-pepper noise; three-dimensional medical images; visual assessment; Biomedical imaging; Biomedical measurements; Computed tomography; Image registration; Isosurfaces; Magnetic resonance imaging; Mutual information; Performance evaluation; Pixel; Surgery;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260129
  • Filename
    4462634