DocumentCode
472253
Title
Extraction of the Intracranial Component from the Rheoencephalographic Signal: A New Approach
Author
Perez, Juan J. ; Guijarro, Enrique ; Sancho, Jeronimo ; Navarre, Arantxa
Author_Institution
Center for Res. & Innovation on Bioeng., Univ. Politecnica de Valencia
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
6064
Lastpage
6067
Abstract
The well-known inherent artifact on the rheoencephalogram (REG) caused by the pulsatility of the scalp blood flow left the REG out of the clinical practice. In fact, depending on the selected electrode arrangement, the measurement of the brain impedance changes time-locked with the heartbeat can be completely buried on that of the scalp. In this work, a novel mathematical method based on the physiological differences between the brain and scalp perfusions is proposed to extract the intracranial information from REG. This method is experimentally applied to REG signals recorded at five electrode positions and results are compared with those derived from our previous theoretical works. Intracranial components extracted from the REG signals are consistent with the stated hypothesis and reproduce the unexpected results obtained with our theoretical models. Although further studies would be needed, the evidences found in this work suggest that the method proposed in this work extracts the intracranial information from the REG signal
Keywords
biomedical electrodes; blood vessels; cardiology; electroencephalography; haemodynamics; mathematical analysis; neurophysiology; brain impedance measurement; electrode arrangement; heartbeat; intracranial component extraction; mathematical method; physiological differences; rheoencephalographic signal; scalp blood flow; scalp perfusions; Biomedical engineering; Blood flow; Data mining; Electrodes; Heart beat; Impedance measurement; Nervous system; Scalp; Source separation; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260544
Filename
4463191
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